Invited Speakers

Juergen Czarske, TU Dresden, Germany
Peter Delfyett, CREOL, The College of Optics, University of Central Florida, USA
Mikhail, Kats, University of Wisconsin, Madison, USA
Sanjay Krishna, Ohio State University, USA
George Papen, University of California San Diego, USA
Alexis Vogt, Monroe Community College, USA
Herbert G. Winful, EECS Department, University of Michigan, USA

Wonshik Choi, Institute for Basic Science in Korea, Korea
Nicholas Durr, Johns Hopkins, USA
Reto Fiolka, UT Southwestern, USA
Adam Glaser, University of Washington, USA
Keisuke Goda, University of Tokyo, Japan
Ali Yanik, UC Santa Cruz, USA

Hiroshi Fujioka, University of Tokyo, Japan
MunPyo Hong, Korea University, Korea
Ifor Samuel, University of St. Andrews, UK
Yoshio Tamura, Display Supply Chain Consultants (DSCC), Korea
Shin-Tson Wu, University of Central Florida, USA

James Buckwalter, UC Santa Barbara, USA
Maurizio Burla, ETH Zurich, Switzerland
Miquel Drummond, Instituto de Telecommunicacoes, Portugal
Mona Jarrahi, UCLA, USA
Tony Kowalczyk, Lockheed Martin, USA
Stephen Ralph, Georgia Tech, USA

Randall Goldsmith, University of Wisconsin, USA
Juliet Gopinath, University of Colorado, Boulder, USA
Mercedeh Khajavikhan, University of Southern California, USA
Shuo Sun, University of Colorado, USA
Chee Wei Wong, UCLA, USA
Zongfu Yu, University of Wisconsin, USA

Liang Feng, University of Pennsylvania, USA
Igor Jovanovic, University of Michigan, USA
Michelle Sander, Boston University, USA
Réal Vallée, University of Laval, Canada

Brad Booth, Microsoft, USA
Brandon Buscaino, Stanford, USA
Jorg-Peter Elbers, ADVA, Germany
Muriel Medard, MIT, USA
Goji Nakagawa, Fujitsu, Japan
Bert Offrein, IBM, Zurich, Switzerland
Benjamin Puttnam, NICT, Japan
Daniel Semrau, UCL, UK

Jacques Albert, Carleton University, Canada
Xiayi Bao, University of Ottawa, Canada
Anna Peacock, ORC Southampton, UK
Shuo Tang, University of British Columbia, Canada

Yuliya Akulova, Intel, USA
Vipul Bhatt, II-VI, USA
Pavel Cheben, NRC Canada, Canada
George Kanellos, University of Bristol, UK
Michal Lipson, Columbia University, USA
Miltos Moralis-Pegios, Aristotle University of Thessaloniki, Greece
Ramana Murty, Broadcom, USA
Radhakrishnan Nagarajan, Inphi, USA
Bo Peng, Lightelligence Inc., USA
Leslie Rusch, Université Laval, Canada
Clint Schow, University of California, Santa Barbara, USA
Yohei Sobu, Fujitsu, Japan
Marco Vitali, Sicoya, Germany
Shiyoshi Yokoyama, Kyushu University, Japan

Aashish Clerk, The University of Chicago, USA
Tobias Herr, CSEM, Switzerland
Alessia Pasquazi, University of Sussex, UK
Jelena Vuckovic, Stanford university, USA

Andreas Beling, University of Virginia, USA
Franklyn Quinlan, NIST, USA
Peng Yao , Phase Sensitive Innovations, USA

Stefan Abel, Switzerland
Wim Bogaerts, Ghent University, Belgium
Frédéric Grillot, Institut Polytechnique de Paris, France
Shinji Matsuo, NTT, Japan
Ming Wu, UC-Berkeley, USA

Elaheh Ahmadi, University of Michigan, USA
Jonathan Fan, Stanford, USA
Michelle Povinelli, University of Southern California, USA

Joshua Bienfang, NIST, USA
Gregory Howland, Rochester Institute of Technology, USA
Chen-Lung Hung, Purdue, USA
Paul Kunz, Army Research Laboratory, USA
Nobuyuki Matsuda, University of Tohoku, Japan
Irina Novikova, College of William and Mary, USA
Mohsen Razavi, University of Leeds, UK

Igor Aharonovich, University of Technology Sydney, Australia
Yasuhiko Arakawa, University of Tokyo, Japan
Weng Chow, Sandia National Lab, USA
Douglas Hall, University of Notre Dame, USA
Jonathan Klamkin, University of California at Santa Barbara, USA
Maki Kushimoto, Nagoya University, Japan

Michael Boroson, OLEDWorks, USA
Hilmi Volkan Demir, Nanyang Technological University, Singapore
Yajie Dong, University of Central Florida USA
Viktor Klimov, Los Alamos, USA
Ifor Samuel, University of St. Andrews, UK

Takashi Asano, Kyoto University, Japan
Wenshan Cai, Georgia Tech., USA
Aydogan Ozcan, UCLA, USA
YongKeun Park, KAIST, Korea
Laurent Schmalen, KIT, Germany
Takahito Tanimura, Fujitsu, Japan

Scott Diddams, NIST & University of Colorado, USA
Alexander Gaeta, University of Columbia, USA
Kaoru Minoshima, University of Electro-Communications (UEC), Japan
Kerry Vahala, Caltech, USA