Invited Speakers

Wonshik Choi Institute for Basic Science in Korea, Korea
Nicholas Durr, Johns Hopkins, USA
Reto Fiolka, UT Southwestern, USA
Adam Glaser, University of Washington, USA
Keisuke Goda, University of Tokyo, Japan
Ali Yanik, UC Santa Cruz, USA

Hiroshi Fujioka, University of Tokyo, Japan
MunPyo Hong, Korea University, Korea
Hermann Oppermann, Fraunhofer IZM, Germany
Yoshio Tamura, Display Supply Chain Consultants (DSCC), Korea

Jerome Bourderionnet, Thales, France
James Buckwalter, UC Santa Barbara, US
Maurizio Burla, ETH Zurich, Switzerland
Miquel Drummond, Instituto de Telecommunicacoes, Portugal
Mona Jarrahi, UCLA, US
Tony Kowalczyk, Lockheed Martin, US
Stephen Ralph, Georgia Tech, US

Randall Goldsmith, University of Wisconsin, USA
Juliet Gopinath, University of Colorado, Boulder, USA
Mercedeh Khajavikhan, University of Southern California, USA
Jingyu Lin, Texas Tech University, USA
Shuo Sun, University of Colorado, USA
Chee-Wei Wong, UCLA, USA
Zongfu Yu, University of Wisconsin, USA

Liang Feng, University of Pennsylvania, USA
Igor Jovanovic, University of Michigan, USA
Michelle Sander, Boston University, USA

David Boertjes, Ciena, Ottawa, Canada
Brad Booth, Microsoft, USA
Brandon Buscaino, Standford, USA
Jorg-Peter Elbers, ADVA, Germany
Muriel Medard, MIT, USA
Goji Nakagawa, Fujitsu, Japan
Bert Offrein, IBM, Zurich, Switzerland
Benjamin Puttnam, NICT, Japan
Daniel Semrau, UCL, UK

Jacques Albert, Carleton University, Canada
Xiayi Bao, University of Ottawa, Canada
Anna Peacock, ORC Southampton, UK
Shuo Tang, University of British Columbia, Canada

Stefan Abel, IBM Zurich, Switzerland
Pavel Cheben, NRC Canada, Canada
George Kanellos, University of Bristol, UK
Bo Peng

Aashish Clerk, The University of Chicago, USA
Tobias Herr, CSEM, Switzerland
Alessia Pasquazi, University of Sussex, UK
Jelena Vuckovic, Stanford university, USA

Andreas Beling, University of Virginia, USA
Yao Peng, Phase Sensitive Innovations, USA
Franklyn Quinlan, NIST, USA

Stefan Abel, IBM Zurich, Switzerland
Wim Bogaerts Ghent, University, Belgium
Frédéric Grillot, Institut Polytechnique de Paris, France
Shinji Matsuo, NTT, Japan
Ming Wu, UC-Berkeley, USA

Elaheh Ahmadi, University of Michigan, USA
Jonathan Fan, Stanford, USA
Michelle Povinelli, University of Southern California, USA

Joshua Bienfang, NIST, USA
Gregory Howland, Rochester Institute of Technology, USA
Paul Kunz, Army Research Laboratory, USA
Nobuyuki Matsuda, University of Tohoku, Japan
Kae Nemoto, National Institute of Informatics, Japan

Ignore Aharonovich, University of Technology Sydney, Australia
Yasuhiko Arakawa, University of Tokyo, Japan
Weng Chow, Sandia National Lab, USA
Douglas Hall, University of Notre Dame, USA
Richard Jones, Intel, USA
Jonathan Klamkin, University of California at Santa Barbara, USA
Naki Kushimoto, Nagoya University, Japan

Michael Boroson, OLEDWorks, USA
Volkan Demir, Nanyang Technological University, Singapore
Viktor Klimov, Los Alamos, USA
Ifor Samuel, University of St. Andrews, UK

Takashi Asano, Kyoto University, Japan
Aydogan Ozcan, UCLA, USA
YongKeun Park, KAIST, Korea
Laurent Schmalen, KIT, Germany
Takahito Tanimura, Fujitsu, Japan

Scott Diddams, NIST & University of Colorado, USA
Alexander Gaeta, University of Columbia, USA
Tobias Kippenberg, EPFL – Swiss Federal Institute of Technology Lausanne, Switzerland
Kaoru Minoshima, University of Electro-Communications (UEC), Japan
Kerry Vahala, Caltech, USA